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International conference on metallurgical coatings and thin films ICMCTF95JEHN, Hermann A; MATTHEWS, Allan; MCGUIRE, Gary E et al.Thin solid films. 1995, Vol 270, Num 1-2, issn 0040-6090, 667 p.Conference Proceedings

International conference on metallurgical coatings and thin films ICMCTF95JEHN, Hermann A; MATTHEWS, Allan; MCGUIRE, Gary E et al.Surface & coatings technology. 1995, Vol 76-77, Num 1-3, issn 0257-8972, 386 p., 1Conference Proceedings

Manufacturabililty of the CMP processFARID MALIK; MASOOD HASAN.Thin solid films. 1995, Vol 270, Num 1-2, pp 612-615, issn 0040-6090Conference Paper

A continuous electrical resistivity measurement in thin filmsCVELBAR, A; PANJAN, P; NAVINSEK, B et al.Thin solid films. 1995, Vol 270, Num 1-2, pp 367-370, issn 0040-6090Conference Paper

Blanching resistant Cu-Cr coating by vacuum plasma sprayCHIANG, K. T; KROTZ, P. D; YUEN, J. L et al.Surface & coatings technology. 1995, Vol 76-77, Num 1-3, pp 14-19, issn 0257-8972, 1Conference Paper

Characterization and adhesion study of thin alumina coatings sputtered on PETCUEFF, R; BAUD, G; BENMALEK, M et al.Thin solid films. 1995, Vol 270, Num 1-2, pp 230-236, issn 0040-6090Conference Paper

Corrosion resistance of Zn coatings produced by air arc depositionPARKANSKY, N; BOXMAN, R. L; GOLDSMITH, S et al.Surface & coatings technology. 1995, Vol 76-77, Num 1-3, pp 352-357, issn 0257-8972, 1Conference Paper

Cross-sectional structure of tetrahedral amorphous carbon thin filmsDAVIS, C. A; KNOWLES, K. M; AMARATUNGA, G. A. J et al.Surface & coatings technology. 1995, Vol 76-77, Num 1-3, pp 316-321, issn 0257-8972, 1Conference Paper

Electrical properties of diamond films grown at low temperatureCHIA-FU CHEN; SHENG-HSIUNG CHEN; KUEN-MO LIN et al.Thin solid films. 1995, Vol 270, Num 1-2, pp 205-209, issn 0040-6090Conference Paper

Formation of metal oxides by cathodic arc depositionANDERS, S; ANDERS, A; RUBIN, M et al.Surface & coatings technology. 1995, Vol 76-77, Num 1-3, pp 167-173, issn 0257-8972, 1Conference Paper

In-situ ellipsometric characterization of the electrodeposition of metal filmsHILFIKER, J. N; THOMPSON, D. W; HALE, J. S et al.Thin solid films. 1995, Vol 270, Num 1-2, pp 73-77, issn 0040-6090Conference Paper

Integration of copper multilevel interconnects with oxide and polymer interlevel dielectricsGUTMANN, R. J; CHOW, T. P; LAKSHMINARAYANAN, S et al.Thin solid films. 1995, Vol 270, Num 1-2, pp 472-479, issn 0040-6090Conference Paper

Mechanical degradation of coating systems in high-temperature cyclic oxidationPENNEFATHER, R. C; BOONE, D. H.Surface & coatings technology. 1995, Vol 76-77, Num 1-3, pp 47-52, issn 0257-8972, 1Conference Paper

Protection of aluminium by duplex coatingsMUSIL, J; VLCEK, J; JEZEK, V et al.Surface & coatings technology. 1995, Vol 76-77, Num 1-3, pp 341-347, issn 0257-8972, 1Conference Paper

Recent developments in ionized cluster beam thin film depositionCOX, A. J; NAINAPARAMPIL, J. J; TABET, M. F et al.Thin solid films. 1995, Vol 270, Num 1-2, pp 637-642, issn 0040-6090Conference Paper

Roughness determination of plasma-modified surface layers with atomic force microscopyALMQVIST, N; RUBEL, M; WIENHOLD, P et al.Thin solid films. 1995, Vol 270, Num 1-2, pp 426-430, issn 0040-6090Conference Paper

Space-charge-limited conductivity in evaporated cadmium selenide thin filmsODUOR, A. O; GOULD, R. D.Thin solid films. 1995, Vol 270, Num 1-2, pp 387-390, issn 0040-6090Conference Paper

The chemical vapor deposition of copper and copper alloysDOPPELT, P; BAUM, T. H.Thin solid films. 1995, Vol 270, Num 1-2, pp 480-482, issn 0040-6090Conference Paper

Adhesion of diamond coatings on cemented carbidesNESLADEK, M; VANDIERENDONCK, K; QUAEYHAEGENS, C et al.Thin solid films. 1995, Vol 270, Num 1-2, pp 184-188, issn 0040-6090Conference Paper

Artifacts in SPM measurements of thin films and coatingsLENIHAN, T. G; MALSHE, A. P; BROWN, W. D et al.Thin solid films. 1995, Vol 270, Num 1-2, pp 356-361, issn 0040-6090Conference Paper

Characterization of In0.48Ga0.52P-based thin-layer structures using spectroscopic ellipsometryWATANABE, K; KOBAYASHI, K; CHEONG CHEE WONG et al.Thin solid films. 1995, Vol 270, Num 1-2, pp 97-102, issn 0040-6090Conference Paper

Characterization of diamond films deposited on titanium and its alloysRATS, D; VANDENBULCKE, L; HERBIN, R et al.Thin solid films. 1995, Vol 270, Num 1-2, pp 177-183, issn 0040-6090Conference Paper

Characterization of ion-beam-deposited diamond-like carbon filmsPALSHIN, V; MELETIS, E. I; VES, S et al.Thin solid films. 1995, Vol 270, Num 1-2, pp 165-172, issn 0040-6090Conference Paper

Deposition of diamond-like carbon on a titanium biomedical alloyIANNO, N. J; DILLON, R. O; ABBAS ALI et al.Thin solid films. 1995, Vol 270, Num 1-2, pp 275-278, issn 0040-6090Conference Paper

Dielectric reference coatings for the evaluation of thin film characterization techniquesBECK, U; REINERS, G.Thin solid films. 1995, Vol 270, Num 1-2, pp 85-90, issn 0040-6090Conference Paper

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